Tuesday, November 7, 2023
“What New Challenges Come with the Capabilities of HAXPES?”
We know how to do XPS well, even if it is not always done that way. Join us for an evening community forum discussion on the comparison of the requirements for quantitative studies using HAXPES (through the analysis of peak intensities or of the background) in comparison to traditional laboratory XPS. The applications and use of HAXPES have been increasing due to the greater availability of higher energy X-ray sources in commercial instruments, increased access to synchrotron sources, and to improving quantitative data analysis. This forum will examine the similarities and differences among XPS, synchrotron-HAXPES, and laboratory-HAXPES. As a member of the surface analysis community, we need your input to help us identify the most important issues that individual researchers and the surface community need to address including:
• Requirements for Additional Information for Analysts
• Experimental and Analysis Protocols
• New Standards or Guides such as the Determination of Transmission Functions
Our panel will have representation from industry, academia, and national laboratories. We hope to have a lively discussion focused on ensuring that the high level of surface analysis that our AVS community employs is understood and accessible by the ever-broadening user base of surface analysis techniques.
The moderator of the ASTM/ASSD workshop will be Alex Shard and the panelists will be David Cant, Olivier Renault, and Thierry Conard.